美国MI Technologies www.mi-technologies.com
MI是一家有着60年历史的专业开发生产天线测量系统的公司。是目前全球最大的天线测量，天线罩测量和散射测量系统的制造商和集成商之一。
MI的产品线覆盖了天线，天线罩，散射测量所需要的各个领域硬件和软件产品。
MI公司在美国以及世界各地设立了办事处和服务机构，为全球的客户提供专业的技术服务。
我们服务的客户主要为通信、电子，国防领域的微波器件，天线设计，生产和制造企业，以及国防研究所和知名高校。

天线量测系统，雷达截面量测系统，天线罩量测系统，天线，天线座及控制系统
MI Technologies delivers engineering solutions and advanced products, systems, and software to address a wide range of technical applications where precise measurement, control or data acquisition is required.

For more than 50 years, MI Technologies has been the leading global supplier of RF and Microwave antenna test and measurement products, systems and services. The business helped define the concept of microwave measurement with the introduction of the first antenna pattern recorder over 50 years ago. Since its beginning, the business has compiled an impressive array of test and measurement technology firsts including:

The first fully automated antenna measurement system
The first automated commercial planar scanner
The first commercially available compact range
The first commercial spherical near-field measurement system
Today, MI Technologies continues its industry leadership with fast, reliable and easy-to-use automated test and measurement systems for antenna, radome, radar cross section and component test and measurement applications.

While the Company抯 strength is grounded in the areas of antenna, radome, and radar cross section measurements, MI Technologies?capabilities in engineering and software development and its extensive line of electromechanical products may be applied to a much broader range of uses including the areas of automotive telematics, communications, general component measurement and many more automated test equipment (ATE) applications.

MI Technologies?test equipment and positioning systems add value to our customer抯 research; development, monitoring and manufacturing processes and our engineering services and customer support provide the right solutions to the most demanding test and measurement requirements.