德国FOCUS GmbH www.focus-gmbh.com
FOCUS 公司成立于1990 年，从事电子分光仪和表面分析仪器的开发与生产。大部分FOCUS产品由位于德国Taunusstein 市的OMICRON 公司在全球经销。
产品系列包括常规表面分析仪，如电子分光计和超真空紫外光源。除用于制备纳米级结构的蒸发器之外，FOCUS 公司还开发了一种纳米分析仪－ FOCUS PEEM。 它是一种紧凑型光电显微镜，用于各种表面的电子光学成像，分辨率可达40 纳米。该仪器的性能可通过选用能量过滤器得到加强。能量过滤器为能量选择PEEM 成像（光谱显微镜）和局部能量分布光谱（显微分光镜）提供了方便的方法。PEEM Nano-ESCA 系统即是一个高性能的能量过滤器。目前，该仪器正在进一步开发中，以便为纳米分析科学提供标准。该仪器一方面提高了横向分辨率，另一方面，除了传统的表面分析科学和表面磁性法之外，该仪器又开辟了一个新的应用领域。兼容型样本转移系统保障了PEEM 以及其它诸如STM（扫描隧道显微镜）/ AFM（原子力显微镜）之类的纳米分析仪器的应用。PEEM 可以用于检查纳米级工作函数的对比、磁性表面域和化合
物的横向分布。
FOCUS-SPLEED 是一种用于电子自旋分析的专利产品，配合一个扫描电子显微镜使用可以实现纳米级磁畴成像(SEMPA)。
Since the foundation in 1990, the company FOCUS GmbH is engaged in the development
and creation of instruments for electron spectroscopy and surface analysis. The main part of
the FOCUS products is distributed all over the world by the company OMICRON GmbH in
Taunusstein/Germany.
The product range includes usual surface science instruments like electron spectrometers
and VUV-light sources. Beside the evaporators, which are used for the preparation of
nanoscaled structures, FOCUS has developed a nanoanalytic instrument, the FOCUS PEEM.
It is a compact photoelectron microscope, which is used for the electron optical mapping
of surfaces down to the resolution range of 40 nm. The instrument can be enhanced by an
optional energy filter, which introduce simple methods for energy selective PEEM imaging
(spectromicroscopy) and spectra of local energy distribution (microspectroscopy). A high
performance filter is invented as the PEEM Nano-ESCA system. The instrument is at present
under further development to allocate a standard for nanoanalytic and science. On the one
hand stands the enhancement of the lateral resolution, on the other hand there is the opening of
a new application range beside the classical surface science and magnetism. The application
of the PEEM together with other nanoanalytic instruments like STM/AFM is warranted by
compatible sample transfer systems. The PEEM can be used for visualisation of nanoscaled
workfunction contrast, magnetic surface domains and lateral distribution of compounds.
The patented instrument FOCUS-SPLEED, a detector for spin analysis of electrons, enables
together with a scanning electron microscope the imaging of nanoscaled magnetic domains
(SEMPA).
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总部
FOCUS GmbH
Neukircher Straße 2
D-65510 Hünstetten-Kesselbach
Germany/ 德国
电话： (+)49 - 61 26 40 140
传真： (+)49 - 61 26 40 14 10
电邮： info@focus-gmbh.com
网站： www.focus-gmbh.com
联系人
Michael SCHICKETANZ 先生
产品经理
电话：(+)49 - 61 26 40 14 15
传真：(+)49 - 61 26 40 14 10
电邮： m.schicketanz@focus-gmbh.com