低成本原子力显微镜，根据应用不同，可分为教学级别，科研级别，能够满足高校和研究所的研究生实验应用，同时科研级别设备也能够满足各种科研需求。 本产品主要定位于低价位的原子力显微镜，满足大部分科研人员的工作需求，扩展原子力的使用人群。
AFM offers a wide Spectrum of Measurement Methods:
- High Resolution Dynamic & Contact Mode
- Current-AFM Mode
- Lateral Force Mode
- Force Spectroscopy
- Kelvin Probe Force Microscopy
- Magnetic Force Microscopy
- Electrical Force Microscopy
- Nano-Lithography with script-language
- Elastic Force Microscopy (Force Modulation Mode)
SYSTEM PARAMETERS:
lateral resolution: < 1 nm (practical resolution)
technical resolution: 0.19 nm (18 bit achieved technical resolution)
mathematical resolution: 32 Bit (< 0.1 pm)
height resolution: < 150 pm noise floor in DNC (atomic steps and layers)
technical resolution: 0.026 nm (18 bit achieved technical resolution)
maximum scan range: 50 mm (standard, others possible on request), z-range: 6 μm
maximum sample size: 4 cm x 6 cm
manual positioning range: 5 mm x 5 mm
accessories: 15 cantilevers; 1 calibration grating UMG01
20 sample holders; 2 sample boxes, tweezers
OPTIONAL FEATURES (NOT NECESSARY FOR STANDARD APPLICATIONS):
1.Vibration isolation table under the microscope
2.Hardware scanner linearisation
3.Glass bell jar for acoustic protection
4.Additional cantilever packages and gratings
5.enhanced LFM mode sensitivity due to a spot-like laser diode
6.additional LockIn amplifier for dynamic EFM or MFM
7.implemented Kelvin feedback
8.current amplifier for conductance AFM incl. power supply
SPIP – Scanning Probe Image Processor - with all costumer specific modules from Imaging
Metrology
9. 2nd TFT monitor
